Mask structure for manufacture of trench type semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257SE27091, C257SE29200, C257SE29257, C257SE29260, C257SE21551, C438S242000, C438S246000, C438S424000, C438S514000, C438S700000

Reexamination Certificate

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07808029

ABSTRACT:
A mask structure and process for forming trenches in a silicon carbide or other wafer, and for implanting impurities into the walls of the trenches using the same mask where the mask includes a thin aluminum layer and a patterned hard photoresist mask. A thin LTO oxide may be placed between the metal layer and the hard photoresist mask.

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patent: 04243128 (1992-08-01), None

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