Mask forming and removing method, and semiconductor device,...

Semiconductor device manufacturing: process – Chemical etching – Having liquid and vapor etching steps

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S707000, C438S715000

Reexamination Certificate

active

07148148

ABSTRACT:
A mask forming method that can reduce manufacturing cost is disclosed. The method forms a mask on the surface of a member to be processed in order to form a desired pattern using liquid material for patterning. The method also includes applying resist to the entire surface of the member to be processed, drying the applied resist, patterning by removing the resist in a pattern-formation area using photolithography, and heating the resist.

REFERENCES:
patent: 5658697 (1997-08-01), Lin
patent: 5863233 (1999-01-01), Porter et al.
patent: 6120674 (2000-09-01), Porter et al.
patent: 6613486 (2003-09-01), Ohtsu et al.
patent: 2002/0011421 (2002-01-01), Haba et al.
patent: 1 113 502 (2001-07-01), None
patent: A-9-186069 (1997-07-01), None
patent: A-2000-277520 (2000-10-01), None
patent: A-2000-282240 (2000-10-01), None
patent: A-2000-357685 (2000-12-01), None
patent: A-2001-284289 (2001-10-01), None
patent: A-2002-50610 (2002-02-01), None
patent: WO00/59040 (2000-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Mask forming and removing method, and semiconductor device,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Mask forming and removing method, and semiconductor device,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Mask forming and removing method, and semiconductor device,... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3710811

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.