Mask for silicon crystallization, method for crystallizing...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C117S043000

Reexamination Certificate

active

07892704

ABSTRACT:
A mask for silicon crystallization capable of minimizing the number of grain boundaries in crystallized silicon, a method for crystallizing silicon using the mask, and a display device are presented. The mask includes a group of slits that are inclined at a predetermined angle with respect to a scan direction and a group of slits including slits inclined at a predetermined angle with respect to the former group of slits. The groups of slits are separated by an interval along the scan direction, and the substrate and/or mask is moved by the interval between irradiation by laser through the slits. Further, there are provided a method for crystallizing silicon using the mask and a display device. By reducing the number of grain boundaries that extend horizontally or vertically on the substrate, the invention obviates a design limitation associated with the directional anisotropy in sequential lateral solidification (SLS) technique.

REFERENCES:
patent: 6521473 (2003-02-01), Jung
patent: 6706545 (2004-03-01), Jung
patent: 2004/0235277 (2004-11-01), Crowder
patent: 2005/0173752 (2005-08-01), Chung et al.
patent: 2006/0154154 (2006-07-01), Sun
patent: 00/14784 (2000-03-01), None

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