Mask for photolithography, method of forming thin film,...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C430S321000, C430S396000

Reexamination Certificate

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07153614

ABSTRACT:
A mask for photolithography in which a semi-transmission film is formed so that the phase difference of lights passing through a semi-transmission portion and a transmission portion of the mask for photolithography is between (−¼+2 m).π and (¼+2 m).π inclusive, where m is an integer. The invention makes it possible to efficiently and properly form a thin film having a multi-step structure by a single process.

REFERENCES:
patent: 2000-075305 (2000-03-01), None

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