Mask for crystallizing and method of crystallizing amorphous...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S531000, C257SE21134

Reexamination Certificate

active

11004102

ABSTRACT:
A method of crystallizing amorphous silicon using a mask having a transmitting portion including a plurality of stripes, wherein end lines of at least two stripes are not collinear; and a blocking portion enclosing the plurality of stripes includes the steps of setting the mask over a substrate having an amorphous silicon layer, applying a first laser beam to a first area of the amorphous silicon layer through the mask, thereby forming a first crystallization region, moving the substrate in a first direction, thereby disposing the blocking portion of the mask over the first crystallization region, and applying a second laser beam to the first area of the amorphous silicon layer through the mask, thereby forming a second crystallization region.

REFERENCES:
patent: 6117752 (2000-09-01), Suzuki
patent: 6767804 (2004-07-01), Crowder
patent: 2003/0199176 (2003-10-01), Adachi et al.
patent: 2000-0001170 (2000-01-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Mask for crystallizing and method of crystallizing amorphous... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Mask for crystallizing and method of crystallizing amorphous..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Mask for crystallizing and method of crystallizing amorphous... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3752404

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.