Mask blank manufacturing method and sputtering target for...

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

Reexamination Certificate

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Details

C204S192120, C204S192150, C204S298120, C204S298130, C204S298200

Reexamination Certificate

active

07833387

ABSTRACT:
A sputtering target for manufacturing a mask blank having a backing plate5where a portion for bonding a target member4is protruded like the convex with respect to a base portion5′, and the target member4being formed to have a larger surface area than the area of the bonding portion of the backing plate5with extending from the bonding portion over a whole periphery with a bonding agent30interposed in-between, and further a metal40is deposited to a concave portion formed by a combination of the two structures in such a manner that the elution of the bonding agent30can be sealed.

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patent: 520401 (2003-02-01), None
Machine Translation for Japanese patent 2002-090978 dated Mar. 27, 2002. (Japanese patent cited on Applicant's IDS of Jan. 6, 2005).
Machine Translation of 2001-059168 dated Mar. 6, 2001.
Machine Translation of Minami et al. (Japan 08-291-382) dated Nov. 5, 1996.
Taiwanese Office Action Issued Jan. 3, 2008.
Japanese Office Action dated Jun. 13, 2008.

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