Mask and method of manufacturing the same

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C430S311000

Reexamination Certificate

active

07923176

ABSTRACT:
A mask includes a transparent substrate, a light-blocking layer and a halftone layer. The light-blocking layer includes a source electrode pattern portion including a first electrode portion, a second electrode portion and a third electrode portion, and a drain electrode pattern portion disposed between the second electrode portion and the third electrode portion. The halftone layer includes a halftone portion corresponding to a spaced-apart portion between the source electrode pattern portion and the drain electrode pattern portion, and a dummy halftone portion more protrusive than ends of the second electrode portion and the third electrode portion. Thus, a photoresist pattern corresponding to a channel portion of a thin film transistor (TFT) may be formed with a uniform thickness, to thereby prevent an excessive etching of the channel portion.

REFERENCES:
patent: 2002/0182545 (2002-12-01), Minami et al.
patent: 2002/0186332 (2002-12-01), Kwak et al.
patent: 2003/0091940 (2003-05-01), Nakao
patent: 2003/0203287 (2003-10-01), Miyagawa
patent: 2005/0208427 (2005-09-01), Hayano et al.
patent: 2007/0037070 (2007-02-01), Ohnuma et al.

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