Mask and method for fabricating semiconductor device using...

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21294, C430S005000

Reexamination Certificate

active

08067311

ABSTRACT:
A mask for forming a metal line and a via contact, and a method for fabricating a semiconductor device using the same, minimizes misalignment. The mask includes a first mask region having a dark tone for light shading, a second mask region having a half tone, being disposed within the first mask region to form the metal line, and a third mask region having a clear tone, being disposed within the second mask region to form the via contact.

REFERENCES:
patent: 7691738 (2010-04-01), Lee
patent: 2002/0058401 (2002-05-01), Kim
patent: 2005/0112957 (2005-05-01), Yang et al.
patent: 2008/0090159 (2008-04-01), Yoshikawa et al.
patent: 2009/0108454 (2009-04-01), Lee
patent: 2010/0003823 (2010-01-01), Chen et al.
patent: 2010/0136781 (2010-06-01), Kulkarni et al.
patent: 10-2002-0054642 (2002-07-01), None
patent: 10-2003-0066999 (2003-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Mask and method for fabricating semiconductor device using... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Mask and method for fabricating semiconductor device using..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Mask and method for fabricating semiconductor device using... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4277463

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.