Marking of and searching for initial defective blocks in...

Details Marking of and searching for initial defective blocks in... Marking of and searching for initial defective blocks in...

2005-10-18

2005-10-18

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital data error correction

C714S048000, C714S700000, C714S704000, C714S025000

Reexamination Certificate

active

06957377

ABSTRACT:
A method of marking an initial defective block in a semiconductor memory device having a memory area thereof divided into a plurality of blocks and provided with an ECC function includes the steps of detecting an initial defective block; and writing an ECC code causing an ECC error in a predetermined area of the initial defective block.

REFERENCES:
patent: 5157670 (1992-10-01), Kowal
patent: 5956473 (1999-09-01), Ma et al.
patent: 6058047 (2000-05-01), Kikuchi
patent: 6101614 (2000-08-01), Gonzales et al.
patent: 6397357 (2002-05-01), Cooper
patent: 6412089 (2002-06-01), Lenny et al.
patent: 6526537 (2003-02-01), Kishino

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