Mark configuration, wafer with at least one mark...

Active solid-state devices (e.g. – transistors – solid-state diode – Alignment marks

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S401000, C438S462000, C438S975000

Reexamination Certificate

active

06982495

ABSTRACT:
A mark configuration for the alignment and/or determination of a relative position of at least two planes in relation to one another in a substrate and/or in layers on a substrate during lithographic exposure, in particular, in the case of a wafer during the production of DRAMs, includes a mark structure, and at least one layer of a definable thickness underneath the mark structure for adjusting the physical position of the mark structure relative to a reference plane in or on the substrate. Also provided is a wafer having such a configuration and a process for providing such a configuration. The invention allows a mark configuration to have mark structures exhibiting good contrast regardless of the design or the process conditions.

REFERENCES:
patent: 5925937 (1999-07-01), Jost et al.
patent: 5969428 (1999-10-01), Nomura et al.
patent: 6046508 (2000-04-01), Miyatake
patent: 6140711 (2000-10-01), Machida et al.
patent: 6181018 (2001-01-01), Saino
patent: 6313542 (2001-11-01), Pramanik et al.
patent: 6440816 (2002-08-01), Farrow et al.
patent: 6501189 (2002-12-01), Kim et al.
patent: 6617702 (2003-09-01), Hsu et al.
patent: 6635567 (2003-10-01), Ebertseder et al.
patent: 100 00 759 (2001-05-01), None
patent: 100 46 925 (2001-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Mark configuration, wafer with at least one mark... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Mark configuration, wafer with at least one mark..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Mark configuration, wafer with at least one mark... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3531976

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.