Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2006-12-12
2006-12-12
Lamarre, Guy J. (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
Reexamination Certificate
active
07149948
ABSTRACT:
A fault-tolerant magnetoresistive solid-state storage device (MRAM) in use performs error correction coding and decoding of stored information, to tolerate physical defects. At manufacture, the MRAN device is tested to confirm that each set of storage cells is suitable for storing ECC encoded data, using either a parametric evaluation (step602), or a logical evaluation (step603) or preferably a combination of both. Failed cells are identified and a count is formed, suitably in terms of ECC symbols206that would be affected by such failed cells (step604). The count can be compared to a threshold (step605) to determine suitability of the accessed storage cells and a decision made (step606) on whether to continue with use of those cells, or whether to take remedial action.
REFERENCES:
patent: 4069970 (1978-01-01), Buzzard et al.
patent: 4209846 (1980-06-01), Seppa
patent: 4216541 (1980-08-01), Clover et al.
patent: 4458349 (1984-07-01), Aichelmann, Jr. et al.
patent: 4845714 (1989-07-01), Zook
patent: 4933940 (1990-06-01), Walter et al.
patent: 4939694 (1990-07-01), Eaton et al.
patent: 5233614 (1993-08-01), Singh
patent: 5263030 (1993-11-01), Rotker et al.
patent: 5313464 (1994-05-01), Reiff
patent: 5321703 (1994-06-01), Weng
patent: 5428630 (1995-06-01), Weng et al.
patent: 5459742 (1995-10-01), Cassidy et al.
patent: 5488691 (1996-01-01), Fuoco et al.
patent: 5502728 (1996-03-01), Smith, III
patent: 5504760 (1996-04-01), Harari et al.
patent: 5590306 (1996-12-01), Watanabe et al.
patent: 5621690 (1997-04-01), Jungroth et al.
patent: 5745673 (1998-04-01), Di Zenzo et al.
patent: 5793795 (1998-08-01), Li
patent: 5848076 (1998-12-01), Yoshimura
patent: 5852574 (1998-12-01), Naji
patent: 5852874 (1998-12-01), Walker
patent: 5864569 (1999-01-01), Roohparvar
patent: 5887270 (1999-03-01), Brant et al.
patent: 5966389 (1999-10-01), Kiehl
patent: 5987573 (1999-11-01), Hiraka
patent: 6009550 (1999-12-01), Gosula et al.
patent: 6112324 (2000-08-01), Howe et al.
patent: 6166944 (2000-12-01), Ogino
patent: 6233182 (2001-05-01), Satou et al.
patent: 6275965 (2001-08-01), Cox et al.
patent: 6279133 (2001-08-01), Vafai et al.
patent: 6407953 (2002-06-01), Cleeves
patent: 6408401 (2002-06-01), Bhavsar et al.
patent: 6430702 (2002-08-01), Santeler et al.
patent: 6456525 (2002-09-01), Perner et al.
patent: 6483740 (2002-11-01), Spitzer et al.
patent: 6574775 (2003-06-01), Chouly et al.
patent: 6684353 (2004-01-01), Parker et al.
patent: 2002/0029341 (2002-03-01), Juels et al.
patent: 2003/0156469 (2003-08-01), Viehmann et al.
patent: 0 494 547 (1992-07-01), None
patent: 0 918 334 (1999-05-01), None
patent: 1 132 924 (2001-09-01), None
patent: 03-244218 (1991-10-01), None
patent: 10-261043 (1998-09-01), None
Abstract of Japanese Patent No. JP 60007698, published Jan. 16, 1985, esp@cenet.com.
Peterson, W.W. and E.J. Weldon, Jr.,Error-Correcting Codes, Second Edition, MIT Press, Ch. 1-3, 8 and 9 (1994).
Reed-Solomon Codes and Their Applications, S.B. Wicker and V.K. Bhargava, ed., IEEE Press, New York, Ch. 1, 2, 4 and 12 (1994).
Davis James A.
Jedwab Jonathan
Morley Stephen
Paterson Kenneth Graham
Perner Frederick A.
Hewlett--Packard Development Company, L.P.
Lamarre Guy J.
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