Manufacturing method of semiconductor device and...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Metallic housing or support

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21513

Reexamination Certificate

active

07989267

ABSTRACT:
Improvement in the reliability of a semiconductor device is aimed at. By heating a lead frame, after preparing a lead frame with a tape, until a resin molding is performed, at the temperature 160 to 300° C. (preferably 180 to 300° C.) for a total of more than 2 minutes in the atmosphere which has oxygen, crosslinkage density becoming high in resin of adhesives, a low molecular compound volatilizes and jumps out outside, therefore as a result, since a low molecular compound does not remain in resin of adhesives, the generation of copper migration can be prevented.

REFERENCES:
patent: 5851853 (1998-12-01), Lee et al.
patent: 6858473 (2005-02-01), Hosokawa et al.
patent: 7125750 (2006-10-01), Kwan et al.
patent: 7132755 (2006-11-01), Hosokawa et al.
patent: 7235888 (2007-06-01), Hosokawa et al.
patent: 7262514 (2007-08-01), Yoshikawa et al.
patent: 7294217 (2007-11-01), Beatson et al.
patent: 9-153587 (1997-06-01), None
patent: 10-163410 (1998-06-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Manufacturing method of semiconductor device and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Manufacturing method of semiconductor device and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Manufacturing method of semiconductor device and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2714732

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.