Manufacturing method of semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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Details

C257S326000, C257SE21700, C257SE27112, C438S142000, C438S151000

Reexamination Certificate

active

07851279

ABSTRACT:
The invention provides a semiconductor device and its manufacturing method in which a memory transistor and a plurality of thin film transistors that have gate insulating films with different thicknesses are fabricated over a substrate. The invention is characterized by the structural difference between the memory transistor and the plurality of thin film transistors. Specifically, the memory transistor and some of the plurality of thin film transistors are provided to have a bottom gate structure while the other thin film transistors are provided to have a top gate structure, which enables the reduction of characteristic defects of the transistor and simplification of its manufacturing process.

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International Search Report (Application No. PCT/JP2008/061077) dated Sep. 30, 2008.
Written Opinion (Application No. PCT/JP2008/061077) dated Sep. 30, 2008.

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