Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2011-01-25
2011-01-25
Wilson, Allan R (Department: 2815)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C257SE29295, C438S151000
Reexamination Certificate
active
07875509
ABSTRACT:
In a manufacturing method of a SOI type high withstand voltage semiconductor device formed on a support substrate via an insulation film, a small-sized semiconductor device having small dispersion of withstand voltage is manufactured by introducing impurities into the whole surface of a p-type or n-type SOI substrate having an impurity concentration of 2E14 cm−3or less and serving as an active layer of the semiconductor device with an ion implantation method and thereby forming a drift layer.
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Arai Taiga
Hara Kenji
Mori Mutsuhiro
Sakano Junichi
Shirakawa Shinji
Antonelli, Terry Stout & Kraus, LLP.
Hitachi , Ltd.
Wilson Allan R
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