Manufacturing method of semiconductor apparatus and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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C257SE29295, C438S151000

Reexamination Certificate

active

07875509

ABSTRACT:
In a manufacturing method of a SOI type high withstand voltage semiconductor device formed on a support substrate via an insulation film, a small-sized semiconductor device having small dispersion of withstand voltage is manufactured by introducing impurities into the whole surface of a p-type or n-type SOI substrate having an impurity concentration of 2E14 cm−3or less and serving as an active layer of the semiconductor device with an ion implantation method and thereby forming a drift layer.

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