Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2005-11-22
2010-06-08
Ghyka, Alexander G (Department: 2812)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C438S622000, C438S637000, C438S662000, C438S795000, C257SE21174, C257SE21273, C257SE21581
Reexamination Certificate
active
07732349
ABSTRACT:
The invention provides a manufacturing method of an insulating film having a plurality of pores, as well as a manufacturing method of a highly integrated semiconductor device with high yield. According to the invention, a porous insulating film is formed by forming a plurality of pores in an interlayer insulating film using a laser beam, which results in lower dielectric constant of the interlayer insulating film. In addition, a composition containing conductive particles is discharged onto the porous insulating film by a droplet discharge method typified by an ink jet printing method, and then baked to form a wire. As the laser beam, an ultrashort pulse laser beam is preferably used.
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Notification of the First Office Action dated Sep. 5, 2008 in Chinese Counterpart Application No. 200510129035.6, with English translation.
Costellia Jeffrey L.
Ghyka Alexander G
Nixon & Peabody LLP
Semiconductor Energy Laboratory Co,. Ltd.
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