Manufacturing method for semiconductor depositing device

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Self-aligned

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438365, 438366, H01L 21331

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057312400

ABSTRACT:
A method of manufacturing a semiconductor device includes the steps of: depositing a semiconductor film onto a semiconductor substrate, the semiconductor film having a main component which is the same material as the semiconductor substrate; and forming a first insulating layer on the semiconductor substrate. This method also includes the steps of: removing predetermined areas from the first insulating layer and the semiconductor film so as to form an opening; forming a second insulating layer inside the opening and on the first insulating layer; and removing the second insulating layer by anisotropic etching so that the side wall of the opening remains.

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IBM Technical Disclosure Bulletin, vol. 25, No. 11B, Apr. 1983 "Polysilicon Base-Etched Transistor", pp. 6175-6176 by H.S. Bhatia et al.
Applied Physics Letters, vol. 58. No. 19, May 13, 1991, NY,NY, pp. 2087-2089, by H.W. Lee et al "High deposition rate laser direct writing of A1 on Si".
Journal of Applied Physics, vol. 66, No. 6, Sep. 15, 1989, pp. 2395-2401 by A. Kamgar et al "Self-aligned TiN barrier formation by rapid thermal nitridation of TiSi.sub.2 in ammonia".
NEC Research and Development No. 90, Jul. 1988, Tokyo, JP pp. 10-13 by H. Takemura et al "BSA technology for sub-100nm deep base bipolar transistors".

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