Data processing: generic control systems or specific application – Specific application – apparatus or process – Contest or contestant analysis – management – or monitoring
Reexamination Certificate
2011-08-16
2011-08-16
Patel, Ramesh B (Department: 2121)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Contest or contestant analysis, management, or monitoring
C700S049000, C700S104000, C705S007270, C705S007290
Reexamination Certificate
active
08000819
ABSTRACT:
A manufacturing instruction evaluation support system includes a data reading part that reads a manufacturing instruction parameter group and manufacturing performance data corresponding thereto, a parameter sorting part that calculates a risk rate for each manufacturing instruction parameter configuring the manufacturing instruction parameter group and an average value of risk rates among the manufacturing instruction parameters to identify as available choices the manufacturing instruction parameters having the risk rates no greater than the average value, a parameter identifying part that calculates an explanatory variable selection reference value for the manufacturing instruction parameter group and the manufacturing instruction parameters of the available choices with the multiple regression analysis program to identify the manufacturing instruction parameter group or the manufacturing instruction parameters of the available choices having the greater calculated explanatory variable selection reference value as optimum parameters, and a regression equation calculating part that calculates and displays a regression equation when employing the optimum parameters with the multiple regression analysis program.
REFERENCES:
patent: 5557518 (1996-09-01), Rosen
patent: 5870720 (1999-02-01), Chusid et al.
patent: 5940812 (1999-08-01), Tengel et al.
patent: 6117323 (2000-09-01), Haggerty
patent: 6366892 (2002-04-01), Altman et al.
patent: 7844544 (2010-11-01), Haggerty et al.
patent: 7853520 (2010-12-01), Choudhuri et al.
patent: 2004/0186765 (2004-09-01), Kataoka
patent: 2009/0157573 (2009-06-01), Anderson et al.
patent: 2009/0222380 (2009-09-01), Choudhuri et al.
patent: 2009/0248573 (2009-10-01), Haggerty et al.
patent: 2010/0106589 (2010-04-01), Etheredge et al.
Hamamoto Youichi
Hanawa Shinichirou
Hiraoka Kouichi
Hotehama Atsunori
Kondo Akihiro
Brundidge & Stanger, P.C.
Hitachi , Ltd.
Patel Ramesh B
LandOfFree
Manufacturing instruction evaluation support system,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Manufacturing instruction evaluation support system,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Manufacturing instruction evaluation support system,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2672647