Manufacturing a bump electrode with roughened face

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S614000, C257S737000, C257S739000

Reexamination Certificate

active

06872651

ABSTRACT:
The invention includes a semiconductor device, and a method for making the same, wherein bumps of a semiconductor chip and inner leads of a film tape carrier can be securely bonded to each other by thermal welding using a heating unit. A semiconductor wafer50is etched using a potassium iodide or ammonium iodide solution. By the etching, a barrier metal layer48is removed while the upper face of a bump10is simultaneously roughened and many prominences12are formed. The formation of the prominences12increases the surface area of the upper face of the bump10and improves the bonding between the bump10of the semiconductor chip and the lead of the film tape carrier.

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patent: 6084301 (2000-07-01), Chang et al.
patent: 6109507 (2000-08-01), Yagi et al.
patent: 6165820 (2000-12-01), Pace
patent: 6406991 (2002-06-01), Sugihara
patent: 1-136354 (1989-05-01), None
patent: 8-70019 (1996-03-01), None
patent: 11-111761 (1999-04-01), None

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