Manufacture of wafer-scale integrated circuits

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

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1566591, G03C 500

Patent

active

044354983

ABSTRACT:
In the course of manufacturing a wafer-scale integrated circuit, the metalization for interconnection both within each cell and between cells is achieved by the etching of a single metal layer, photoresist being deposited on the layer and exposed using a step-and-repeat mask for those areas within each cell and using a whole-wafer reticle mask for the areas of interconnection between the cells.

REFERENCES:
patent: 3385702 (1968-05-01), Koehler
patent: 3649392 (1972-03-01), Schneck

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