Manipulator for microscopy sample preparation and methods...

Radiant energy – Inspection of solids or liquids by charged particles – Analyte supports

Reexamination Certificate

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Reexamination Certificate

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07041985

ABSTRACT:
Manipulators for handling micron-scale samples, methods for making probes for the manipulators, and methods for using the manipulators are provided. An exemplary manipulator includes a probe, a probe holder, and a mechanical positioner. The probe includes an electrically conductive surface, a proximal end and a distal end where the distal end has a truncated conical shape with a generally flat face, and a bore extending from the proximal end to the face. The probe holder engages the proximal end and includes an inlet in fluid communication with the bore and with a source of sub-ambient pressure. An exemplary microscopy inspection method includes forming a free-standing membrane, positioning the probe of the manipulator proximate to the membrane, drawing the membrane to the face by drawing a vacuum through the bore, placing the membrane on a sample support, and inspecting the membrane with a microscope.

REFERENCES:
patent: 4793674 (1988-12-01), Buzzio et al.
patent: 6072157 (2000-06-01), Klebanoff et al.
patent: 6891170 (2005-05-01), Yu et al.
patent: 6911349 (2005-06-01), Li et al.
Declaration of Haifeng Wang Under 37 C.F.R. § 1.56(a), dated Nov. 1, 2004, 2 pages.

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