Magnetron sputter apparatus and method for forming films by usin

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

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2041922, 204298, C23C 1434

Patent

active

048657093

ABSTRACT:
A magnetron sputter apparatus according to the present invention is constructed so as to satisfy a predetermined optimum relationship between the size of the erosion area on the surface of the target and that of a film forming region. Further, the distance between the target and substrates has a value predetermined for the relationship between the size of the erosion area on the surface of the target and that of the film forming region. By using the magnetron sputter apparatus according to the present invention it is possible to form a homogeneous thin film excellent in step coverage and having a film thickness distribution in which variations are small over a large area.

REFERENCES:
patent: 4025410 (1977-05-01), Stewart
patent: 4581118 (1986-04-01), Class et al.

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