Magnetic transparent conducting oxide film and method of making

Chemistry: electrical and wave energy – Processes and products – Coating – forming or etching by sputtering

Reexamination Certificate

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C204S192150

Reexamination Certificate

active

07011732

ABSTRACT:
Cobalt-nickel oxide films of nominal 100 nm thickness, and resistivity as low as 0.06 Ω·cm have been deposited by spin-casting from both aqueous and organic precursor solutions followed by annealing at 450° C. in air. An increase in film resistivity was found upon substitution of other cations (e.g., Zn2+, Al3+) for Ni in the spinel structure. However, some improvement in the mechanical properties of the films resulted. On the other hand, addition of small amounts of Li decreased the resistivity. A combination of XRD, XPS, UV/Vis and Raman spectroscopy indicated that NiCo2O4is the primary conducting component and that the conductivity reaches a maximum at this stoichiometry. When x<0.67, NiO forms leading to an increase in resistivity; when x>0.67, the oxide was all spinel but the increased Co content lowered the conductivity.

REFERENCES:
patent: 3850665 (1974-11-01), Plumat et al.
patent: 4204028 (1980-05-01), Donley
patent: 4668299 (1987-05-01), Nanao et al.
patent: 4880772 (1989-11-01), Pederson et al.
patent: 4898699 (1990-02-01), Hofmann et al.
patent: 5688442 (1997-11-01), Ando et al.
patent: 5993701 (1999-11-01), Ando et al.
patent: 6221495 (2001-04-01), Wu et al.
patent: 6306525 (2001-10-01), Schicht et al.
patent: 6432545 (2002-08-01), Schicht et al.
patent: 2013724 (1979-08-01), None
Periodic Table of the Elements.
Brown et al., CHEMISTRY The Central Science, 5th Edition, p. 203.
Appandairajan et al., “A Study of Co3−xNixO4(0 ≦×≦ 1) System,” p. 115-120, 1978.
Biaramov et al. “Raman Study of the Phonon Halfwidths and the Phonon-Plasmon Coupling in ZnO,” p. 227-234, 1983.
Domansky et al., “Localized Deposition of Zinc Oxide Films by Automated Fluid Dispensing Method,” p. 116-121, 2000.
Exharos et al., “Spectroscopic Characterization of Processing-Induced Property Changes in Doped ZnO Films,” p. 56-62, 1997.
Ginley et al., “Transparent Conducting Oxides,” p. 15-18, 2000.
Goodwin-Johansson et al., “Artificial Eyelid for Protection of Optical Sensors,” p. 225-231, 2000.
King et al., “The Reduction of Oxygen on Nickel-Cobalt Oxides-II,” p. 493-498, 1974.
Lefez et al., “Characterization of Cobaltite Spinels by Reflectance Spectroscopy,” p. 1263-1267, 1996.
Monkhorst et al., “Special Points for Brillouin-Zone Integrations,” p. 5188-5192, 1976.
Mkeng et al., “Characterization of Spinel-Type Cobalt and Nickel Oxide Thin Films by X-Ray Near Grazing Diffraction, Transmission and Reflectance Spectroscopies, and Cyclic Voltammetry,” p. 1777-1783, 1995.
Payne et al., “Iterative Minimization Techniques for ab inito Total-Energy Calculations: Molecular Dynamics and Conjugate Gradients,” p. 1045-1097, 1992.
Perdew et al., “Self-Interaction Correction to Density-Functional Approximations for Many-Electron Systems,” p. 5048-5079, 1981.
Roginskaya et al., “Characterization of Bulk and Surface Composition of CoxNi1−xOyMixed Oxides for Electrocatalysis,” p. 4621-4627, 1997.
Schumacher et al., “Semiconducting and Electrocatalytic Properties of Sputtered Cobalt Oxide Films,” p. 975-984, 1990.
Tareen et al., “Growth and Electrical Properties of Pure and Ni-Doped Co3 O4 Single Crystals,” p. 989-997, 1984.
Vanderbilt et al., “Soft Self-Consistent Pseudopotentials in a Generalized Eigenvalue Formalism,” p. 7892-7895, 1990.
Vasil'Ev et al., “Structural and Electrical Properties of D.C. Sputtered MnCo2O4Films,” p. 119-124, 1980.
Windisch et al., “Infrared Transparent Spinel Films with P-type Conductivity,” p. 45-52, 2001.
Windisch et al., “Synthesis and Characterization of Transparent Conducting Oxide Cobalt-Nickel Spinel Films,” p. 1647-1651, 2001.
Zhecheva et al., “Lithium Doping of Cobalt-Nickel Spinel Oxides at Low Temperatures,” p. 593-602, 1996.

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