Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-07-01
2008-07-01
Nhu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S431000, C257S659000, C257SE21208, C257SE21665, C257SE27006
Reexamination Certificate
active
11438179
ABSTRACT:
An MTJ MRAM cell is formed between ultra-thin orthogonal word and bit lines of high conductivity material whose thickness is less than 100 nm. Lines of this thickness produce switching magnetic fields at the cell free layer that are enhanced by a factor of approximately two for a given current. Because the lines require thinner depositions, there is no necessity of removing material by CMP during patterning and polishing. Therefore, there is a uniform spacing between the lines and the cell free layer.
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“A 0.18μm Logic-based MRAM Technology for High Performance Nonvolatile Memory Applications”, by A.R. Sitram et al., MRAM Development Alliance, IBM/Infinean Technologies, Hopewell Junction, NY, USA, date unknown.
Guo Yimin
Min Tai
Shi Xizeng
Wang Pokang
Ackerman Stephen B.
Applied Spintronics Inc.
Headway Technologies Inc.
Nhu David
Saile Ackerman LLC
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