Static information storage and retrieval – Systems using particular element – Magnetoresistive
Reexamination Certificate
2006-03-23
2010-10-19
Nguyen, Tuan T. (Department: 2824)
Static information storage and retrieval
Systems using particular element
Magnetoresistive
C365S171000, C365S173000
Reexamination Certificate
active
07817462
ABSTRACT:
MRAM includes a first wiring, a second wiring, and a memory cell. The first wiring extends to a first direction, and the second wiring extends to a second direction. The memory cell includes a free magnetic layer in which a plurality of magnetic layers coupled anti-ferromagnetically through non-magnetic layers are laminated, and is provided at an intersection of the first and second wirings. The magnetization direction of the free magnetic layer is different from the first and second directions. The writing method includes (a) reading a first data stored in the memory cell; (b) comparing a second data to be written to the memory cell and the first data; and (c) changing a direction of a first write current supplied to the first wiring and a direction of the second write current to be supplied to the second wiring, when the first data and second data are different.
REFERENCES:
patent: 5640343 (1997-06-01), Gallagher et al.
patent: 6545906 (2003-04-01), Savtchenko et al.
patent: 7035137 (2006-04-01), Iwata et al.
patent: 7079414 (2006-07-01), Iwata et al.
patent: 7099184 (2006-08-01), Sugibayashi et al.
patent: 7440314 (2008-10-01), Sakimura et al.
patent: 2004/0228198 (2004-11-01), Shimizu
patent: 2008/0013358 (2008-01-01), Ooishi
patent: 2005-266651 (1993-10-01), None
patent: 2002-151758 (2002-05-01), None
patent: 2003-16779 (2003-01-01), None
patent: 2003-298023 (2003-10-01), None
patent: 2003-331574 (2003-11-01), None
patent: 2004-86986 (2004-03-01), None
patent: 2004-87870 (2004-03-01), None
Miura Sadahiko
Sugibayashi Tadahiko
Suzuki Tetsuhiro
Nec Corporation
Nguyen Tuan T.
Young & Thompson
LandOfFree
Magnetic random access memory does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Magnetic random access memory, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetic random access memory will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4152121