Magnetic random access memory

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

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C365S171000, C257S295000

Reexamination Certificate

active

06894919

ABSTRACT:
An MRAM includes a magnetoresistance element configured to store data, an electric current drive line configured to selectively apply a magnetic field to the magnetoresistance element, and a magnetic circuit configured to hold the magnetic field applied from the electric current drive line. The electric current drive line includes a first side facing the magnetoresistance element, a second side reverse to the first side, and two lateral sides between the first and second sides. The magnetic circuit includes a pair of film members consisting essentially of a ferromagnetic material and extending along the two lateral sides of the electric current drive line, such that portions facing the first and second sides of the electric current drive line are left open.

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patent: WO 0010172 (2000-02-01), None
Roy Scheuerlein, et al. “A 10ns Read and Write Non-Volatile Memory Array Using a Magnetic Tunnel Junction and FET Switch in Each Cell” ISSCC 2000 Digest Paper TA 7.2, 2000, pp. 128-129.
Masahige Sato, et al. “Spin-Valve-Like Properties of Ferromagnetic Tunnel Junctions” Jpn. J. Appl. Phys., vol. 36, Part 2, No. 2B, Feb. 15, 1997, pp. 200-201.
Koichiro Inomata, et al. “Spin-Dependent Tunneling Between a Soft Ferromagnetic Layer and Hard Magnetic Nanosize Particles” Jpn. J. Appl. Pys. vol. 36, Part 2, No. 10B, Oct. 15, 1997, pp. 1380-1383.

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