Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-01-05
2008-11-18
Nguyen, Vincent Q. (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S207130, C324S207220, C324S207230
Reexamination Certificate
active
07453269
ABSTRACT:
A microelectromechanical system (MEMS) sensor and method for measuring the motion of an intermediate member and a method for making the MEMS sensor. The MEMS sensor includes a substrate, a lower magnetic member disposed on the substrate, a layer disposed over the substrate, an upper magnetic member disposed at a side of the layer facing the lower magnetic member, an intermediate magnetic member magnetically levitated between the lower magnetic member and upper magnetic member; and a component measuring at least one of motion, forces acting on, and a displacement of the intermediate magnetic member.
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Choi Hyung
Kim Kwon-hee
Kwon Oh-myoung
Won Jong-hwa
Nguyen Vincent Q.
Samsung Electronics Co,. Ltd.
Sughrue & Mion, PLLC
Valone Thomas F.
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