Magnetic memory device and method of writing into the same

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

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C365S171000, C365S173000, C365S225500, C365S243500

Reexamination Certificate

active

07613035

ABSTRACT:
A magnetic memory device includes a memory cell including magnetoresistance effect elements MTJ1, MTJ2and a select transistor connected to the connection node of the magnetoresistance effect elements MTJ1, MTJ2, a first signal line extended in a first direction and connected to the magnetoresistance effect element MTJ1, a second signal line extended in the first direction and connected to the magnetoresistance effect element MTJ2, and a third signal line extended in a second direction and crossing the first signal line in a region where the magnetoresistance effect element MTJ1is formed and crossing the second signal line in a region where the magnetoresistance effect element MTJ2is formed. When memory information is written into the memory cell, the memory information to be memorized is switched by directions of write currents to be flowed to the first and the second signal lines.

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Masaki Aoki et al; “A Novel Voltage Sensing 1T/2MTJ Cell with Resistance Ratio for Highly Stable and Scalable MRAM,” 2005 Symposium on VLSI Circuits Digest of Technical Papers; Jun. 18, 2005; pp. 170-171; Cited ISR.
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International Search Report of PCT/JP2005/022639, date of mailing Jun. 27, 2006.

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