Magnetic memory device and method for reading the same

Static information storage and retrieval – Read/write circuit – Differential sensing

Reexamination Certificate

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C365S158000, C365S171000, C365S173000, C365S207000

Reexamination Certificate

active

07489577

ABSTRACT:
A magnetic memory device comprises a plurality of bit lines BL; memory cells MC disposed at the respective plurality of bit lines, and each including a magnetoresistive effect element MTJ whose resistance value is changed with changes of magnetization direction, and a select transistor Tr connected to the magnetoresistive effect element MTJ, the magnetoresistive effect element MC having one terminal connected to the bit line BL and the other terminal connected to a first signal line GND via the select transistor; dummy cells DC disposed at the respective plurality of bit lines BL, and each including a resistance element R of a constant resistance value, the resistance element having one terminal connected to the bit line BL and the other terminal connected to a second signal line SIGD; and a voltage sense amplifier SA connected to the plurality of bit lines BL.

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patent: 2003-228974 (2003-08-01), None
M. Durlam et al.; “A low power 1Mbit MRAM based on 1T1MTJ bit cell integrated with Copper Interconnects”; 2002 Symposium on VLSI Circuits Digest of Technical Papers.
T. INABA et al.; “Resistance Ratio Read (R3) Architecture for a Burst Operated 1.5V MRAM Macro”; IEEE 2003 Custom Integrated Circuits Conference, pp. 399-402.
J. Nahas et al.; “A 4Mb 0.18μm 1T1MTJ Toggle MRAM Memory”; 2004 IEEE International Solid-State Circuits Conference, pp. 44-45.
International Search Report of PCT/JP2004/018757, date of mailing Apr. 12, 2005.

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