Magnetic memory cell with plural read transistors

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C365S050000, C365S173000

Reexamination Certificate

active

07012832

ABSTRACT:
A magnetic random access memory (MRAM) device has increased ΔR/R for sensing a state of a pin-dependent tunneling (SDT) device. The MRAM device includes plural transistors connected to a read line for sensing the state of the SDT device. Plural transistors lower an underlying resistance during reading, increasing ΔR/R. The plural transistors can share a source region.

REFERENCES:
patent: 5930164 (1999-07-01), Zhu
patent: 6717844 (2004-04-01), Ohtani
patent: 6747301 (2004-06-01), Hiner et al.
patent: 6775183 (2004-08-01), Heide
patent: 2004/0066668 (2004-04-01), Gider et al.
patent: 2005/0002229 (2005-01-01), Matsutera et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Magnetic memory cell with plural read transistors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Magnetic memory cell with plural read transistors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Magnetic memory cell with plural read transistors will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3541359

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.