Static information storage and retrieval – Systems using particular element – Magnetic thin film
Reexamination Certificate
2007-02-13
2007-02-13
Le, Vu A. (Department: 2824)
Static information storage and retrieval
Systems using particular element
Magnetic thin film
C365S158000
Reexamination Certificate
active
10512545
ABSTRACT:
A technology for eliminating the defects in a tunnel insulation film of magnetic tunnel junction and for suppressing generation of a defective bit in an MRAM using magnetic tunnel junction in a memory. The magnetic memory includes a substrate, an interlayer insulation film covering the upper surface side of the substrate, memory cells, and plugs penetrating the interlayer insulation film. The memory cell includes a first magnetic layer formed on the upper surface side of the interlayer insulation film, a tunnel insulation layer formed on the first magnetic layer, and a second magnetic layer formed on the tunnel insulation layer. The plug is connected electrically with the first magnetic layer. The tunnel current passing part of the tunnel insulation layer located between the first and second magnetic layers is arranged, at least partially, so as not to overlap the plug in the direction perpendicular to the surface of the substrate.
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Miura Sadahiko
Numata Hideaki
Sugibayashi Tadahiko
Tsuji Kiyotaka
Le Vu A.
NEC Corporation
Young & Thompson
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