LSI diagnostic system and method of diagnosing LSI

Details LSI diagnostic system and method of diagnosing LSI LSI diagnostic system and method of diagnosing LSI

2005-04-19

2005-04-19

Chung, Phung My (Department: 2133)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C714S030000

Reexamination Certificate

active

06883115

ABSTRACT:
A diagnostic system for finding failures in an integrated circuit includes a scan-chain circuit which is comprised of a plurality of flip-flop circuits electrically connected in series to one another and outputs logic data stored in the flip-flop circuits on receipt of a control signal. The diagnostic system includes (a) a first identifier which identifies a circuit group which is suspected to have failure therein, among circuit groups surrounded by the scan-chain circuit, (b) a first extractor which extracts logic data of an input terminal of the circuit group having been identified by the first identifier, (c) a second extractor which extracts logic data to be input into each of fundamental logic circuits constituting the circuit group, and (d) a second identifier which identifies a fundamental logic circuit suspected to have failure therein by comparing the logic data having been extracted by the second extractor, to one another.

REFERENCES:
patent: 5663967 (1997-09-01), Lindberg et al.
patent: 5850404 (1998-12-01), Sanada
patent: 5944847 (1999-08-01), Sanada
patent: 6684170 (2004-01-01), Sakaguchi
patent: A 61-155874 (1986-07-01), None
patent: A 62-168240 (1987-07-01), None
patent: A 63-169580 (1988-07-01), None
patent: A 2-136936 (1990-05-01), None
patent: A 4-30227 (1992-02-01), None
patent: A 5-72272 (1993-03-01), None
patent: A 5-180908 (1993-07-01), None
patent: A 7-104033 (1995-04-01), None
patent: B2 2727941 (1997-12-01), None
patent: A 11-101859 (1999-04-01), None
patent: A 11-133119 (1999-05-01), None
patent: A 11-174126 (1999-07-01), None
patent: B2 3104739 (2000-09-01), None

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