Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2000-03-03
2002-12-31
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
06502227
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to an LSI design method including a plurality of macro blocks. More particularly, the present invention relates to an LSI design method, which never produces a timing error having influence on an entire specification of an LSI function, after design of a layout and a circuit of detailed portions.
2. Description of the Related Art
A conventional LSI design method including a plurality of macro blocks is described with reference to attached drawings.
FIG. 1
is a flowchart showing a flow of the conventional LSI design method.
At first, in an LSI function specification determining step
21
, a function specification to be defined as the LSI is determined. Next, the function specification is divided into a plurality of function modules. Then, in a function module designing step
22
, all the function modules of the LSI are designed.
Next, in a layout step
23
, a mask layout on the entire LSI is performed. Moreover, in a timing analysis step
24
, a timing analysis as to whether or not the layout circuit satisfies a desirable timing specification is performed based on the layout result.
As a result of the timing analysis, if the desirable timing is not obtained and a timing error is brought about, the operational flow returns back to any one of the LSI function specification determining step
21
, the function module designing step
22
and the layout step
23
, on the basis of content of the timing error. Again, the design is tried.
In the above-mentioned conventional LSI design method, the timing analysis
24
between the function modules or a delay analysis can not be performed, unless the layout
23
for the entire LSI is executed after completion of all the function module designs
22
. If the timing error occurs at the timing analysis step
24
, the operational flow returns back to any one of the LSI function specification determining step
21
, the function module designing step
22
and the layout step
23
, on the basis of the content of the timing error. Again, the design is tried.
Especially, if the timing error can not be solved only by retrying the layout
23
or the function module design
22
and further the review of the timing of the entire system is required and thereby the LSI function specification determination
21
must be retried, the design must be retried from the original stage, at the final stage of the LSI design. Thus, this results in the large retrial, and also leads to the increase of a design time.
Japanese Laid Open Patent Application (JP-A-Heisei-5-197774) discloses the following method of modifying a circuit. A circuit generator having a high level synthesizer which receives an operational specification and prepares an inner representation based on its specification is provided with an input output interface device, an analysis modification managing device and a synthesis modification executing device. The synthesis modification executing device prepares a floor plan of a circuit based on the input operational specification, and checks it based on a constraint item. If there is a violation, the analysis modification managing device analyzes it, and outputs a modification plan.
Japanese Laid Open Patent Application (JP-A-Heisei 9-153084) discloses the following method of automatically designing LSI. After an input of a net list between function macros, a schematic layout process for the function macro is done based on this net list, and a physical specification of the function macro is determined on the basis of the schematic layout. Then, a logically synthesizing process is done based on the determined physical specification, and the layout is performed on the logic obtained from the logical synthesis, based on the schematic layout of the function macro. Thus, the retrial of the circuit synthesis and the like can be extremely reduced by watching out the layout from a stage of a function design for upper layer in which a gate level is not determined. Hence, it is possible to complete the layout design of LSI, in which a delay time and an area of the LSI are optimal, in a short time.
Japanese Laid Open Patent Application (JP-A-Heisei 10-171857) discloses the following method of designing an integrated circuit. Various modules usable as components of design target are registered as parameterized models. Database is prepared in advance for accumulating therein an instance generation information indicative of a procedure of generating an instance for the various modules and an index calculation information indicative of a manner of calculating a design quality index for each abstract. Then, this database is used to design the orientation of a floor plan. That is, also in a high level of an operational level and an RT level, the design quality indexes of the various modules used for the design are calculated by using the database. Then, they are used to execute the floor plan. In accordance with the execution result, the design quality indexes of a circuit size, a delay time and a consumption power of the design target and the like are calculated to accordingly judge whether or not the change of the design is required (whether or not the design specification is satisfied).
SUMMARY OF THE INVENTION
The present invention has been made to solve the above-described problems of the conventional LSI design method. An object of the present invention is to provide an LSI design method of performing a timing analysis at an early stage of LSI design to avoid an occurrence of large retry. Another object of the present invention is to perform a timing analysis on an entire LSI before designing an RT (Register Transfer) level of a function module to avoid the change of the specification, the change of the circuit and the re-layout of the entire LSI resulting from a timing error immediately before the end of the LSI design.
In order to achieve an aspect of the present invention, an LSI design method, includes (a) performing an arrangement wiring on a plurality of macro blocks, (b) performing a timing analysis on the plurality of macro blocks based on the result of the (a) step, and (c) designing an inside portion of each of the plurality of macro blocks based on the result of the (b) step.
In this case, the (b) step includes performing the timing analysis in consideration of a wiring capacitance and a wiring resistor corresponding to the result of the (a) step.
Also in this case, the (c) step includes performing a register transfer level design, a circuit design and a layout design on the inside portions such that the plurality of macro blocks satisfy timing restrictions corresponding to the result of the (b) step, the timing restrictions being given to the plurality of macro blocks.
Further in this case, the (c) step includes performing, after performing the register transfer level design, the circuit design and the layout design on the inside portions as a specific performing, performing a second timing analysis whether the plurality of macro blocks satisfy the timing restrictions based on the result of the specific performing, and performing one of the register transfer level design, the circuit design and the layout design on the inside portions again, when the timing restrictions are not satisfied as the result of the second timing analysis.
In this case, an LSI design method further includes (d) determining a function specification of an LSI, (e) dividing the LSI into the plurality of macro blocks based on the function specification, and (f) determining a size and a shape of each of the plurality of macro blocks to perform a floor plan on an entire portion of the LSI, and wherein the (d), (e), and (f) steps are performed before the (a) step is performed.
Also in this case, when a predetermined timing restriction is not satisfied as the result of the (b) step, at least one of the (d), (e) and (f) steps is performed again.
Further in this case, at least one of the plurality of the macro blocks is a macro block, as a post-designed macro block, of which a design is performed, and
Choate Hall & Stewart
Dinh Paul
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