Low voltage sensing scheme having reduced active power down...

Static information storage and retrieval – Read/write circuit – Including signal clamping

Reexamination Certificate

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C365S205000, C365S227000

Reexamination Certificate

active

07372746

ABSTRACT:
A low voltage sensing scheme reduces active power down standby leakage current in a memory device. During memory's active power down state, the leak current may increase because of the use of P and Nsense amplifiers having low threshold voltages (Vth) for low Vcc sensing of data signals. A clamping device or diode is used between a Psense amplifier control line (e.g. ACT) and Vcc and/or between an Nsense amplifier control line (e.g. RNL*) and Vss (ground potential). The clamping diode is not enabled during normal memory operations, but is turned on during active power down mode to reduce leakage current through ACT and/or RNL* nodes. The clamping device connected to the ACT node may reduce the voltage on the ACT line during power down mode, whereas the clamping device connected to the RNL* node may increase the voltage on the RNL* line during power down mode to reduce sense amplifier leakage current through these nodes.

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tRC 16Mb Embedded DRAM, ISSCC 2004, Session 11, Dram, 11.1.

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