Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-04-18
2006-04-18
Smith, Matthew W. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07032200
ABSTRACT:
A technique improves the performance of an integrated circuit design by selectively replacing low Vttransistors with standard Vttransistors. The selection of gates for replacement may be based on a multi-path timing analysis. If a low Vtvariant of a gate instance increases a path cycle time as compared to a standard Vtcounterpart, the maximum of the path cycle times for all paths that include the low Vtvariant and the maximum of the path cycle time for these paths with a standard Vtvariant are calculated. If the maximum path cycle time for the path including the low Vtvariant is greater than the maximum path cycle time for the path including the standard Vtvariant, then that low Vtvariant is substituted with a standard Vtvariant. Thus, integrated circuit designs prepared in accordance with the invention may exhibit improved cycle times.
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Kim Von-Kyoung
Lai Peter
Satakopan Sriram
Shanmugavel Arvindvel
Xu Shunjiang
Levin Naum B.
Smith Matthew W.
Zagorin O'Brien Graham LLP
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