Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Die bond
Reexamination Certificate
2006-03-07
2006-03-07
Clark, S. V. (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Die bond
C257S707000, C438S118000
Reexamination Certificate
active
07009307
ABSTRACT:
Provided are a semiconductor die flip chip package with warpage control and fabrication methods for such packages. The packages include heat spreaders that are attached to the die and packaging substrate. In general, the modulus of the adhesive, which is used to attach the heat spreader to the substrate, is selected to provide a relatively “soft” connection. The result is a package with less bowing and so improved co-planarity (e.g., in compliance with industry specifications) with the surface to which it is ultimately bound. Moreover, the die and package reliabilities are thereby enhanced.
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U.S. Appl. No. 10/305,671 filed on Nov. 25, 2002 entitled “Flip Chip Package With Warpage Control”.
U.S. Appl. No. 10/719,451 filed Nov. 20, 2003 entitled “Structure And Material For Assembling A Low-K Si Die To Achieve A Low Warpage And Industrial Grade Reliability Flip Chip Package With Organic Substrate”.
Office Action, 12 page document dated Oct. 20, 2004, U.S. Appl. No.: 10/305,671.
Altera Corporation
Beyer Weaver & Thomas LLP
Clark S. V.
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