Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-10-02
2007-10-02
Hu, Shouxiang (Department: 2811)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S314000, C257S315000, C257S320000
Reexamination Certificate
active
11066905
ABSTRACT:
The memory system is comprised of a plurality of memory arrays that are coupled to a processor. The memory arrays are comprised of non-volatile memory cells that have read/write speeds and charge retention times that are different from the other memory arrays of the system. Each of the memory cells of each array has a tunnel layer under an embedded trap layer. Each array has memory cells with a different tunnel layer thickness to change the read/write speeds and charge retention times for that array.
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Dana Lee et al.; Vertical floating-gate 4.5F2Split-gate NOR Flash Memory at 110nm Node; Silicon Storage Technology, Inc. and PowerChip Semiconductor Corporation; 2004 Symposium on VLSI Technology Digest of Technical Papers; pp. 72-73.
Hu Shouxiang
Leffert Jay & Polglaze P.A.
Micro)n Technology, Inc.
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