Static information storage and retrieval – Systems using particular element – Flip-flop
Reexamination Certificate
2006-04-04
2006-04-04
Yona, Connie C. (Department: 2827)
Static information storage and retrieval
Systems using particular element
Flip-flop
C365S230060, C365S189110, C365S156000, C365S189090, C365S205000
Reexamination Certificate
active
07023722
ABSTRACT:
The respective sources of drive transistors included in memory cells that are located in each of multiple columns and connected to a corresponding one of bit line pairs are connected commonly to a low voltage power supply VSS via an assertion transistor. When data is written, the assertion transistor for the memory cells connected to a selected one of the bit line pairs and located in the identical column is negated, so that the sources of the drive transistors in the memory cells in that column are allowed to float. Consequently, even with a low power supply voltage, it is possible to write the data into a single selected memory cell, while data in the unselected memory cells can be retained favorably.
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T. Douseki et al., “Static-Noise Margin Analysis for a Scaled-Down CMOS Memory Cell”, Institute of Electronics Information and Communication Engineers, C-ll vol. J75-C-II No. 7 pp. 350-381, Jul. 1992.
Kanehara Hidenari
Okuyama Hiroaki
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
Yona Connie C.
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