Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of...
Reexamination Certificate
2005-04-19
2005-04-19
Ghyka, Alexander (Department: 2812)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
C438S800000, C423S460000, C423S461000
Reexamination Certificate
active
06881680
ABSTRACT:
The present invention relates to a low nitrogen concentration carbonaceous material with a nitrogen concentration according to glow discharge mass spectrometry of 100 ppm or less, as well as a manufacturing method thereof are provided. A carbonaceous material subjected to a high purification treatment in a halogen gas atmosphere is heat treated under a pressure of 100 Pa or less and at a temperature of 1800° C. or higher, releasing nitrogen in the carbonaceous material and then cooling the material under a pressure of 100 Pa or less or in a rare gas atmosphere.
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Ghyka Alexander
Toyo Tanso Co., Ltd.
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