Low cost polametric detector

Details Low cost polametric detector Low cost polametric detector

2008-05-13

2008-05-13

Nguyen, Tu T (Department: 2886)

Optics: measuring and testing

By polarized light examination

Of surface reflection

Reexamination Certificate

active

07372568

ABSTRACT:
Polarimeters based on transversal division of the input beam and use of different polarization elements in different polarization states to change polarizations of different portions of the input beam so that the power levels of the different portions of the input beam can be measured to determine the polarization state of the input beam. A wedged substrate can be used to direct the different portions of the input beam at different directions and a lens can be used to focus these different portions at different locations at a plane.

REFERENCES:
patent: 5982539 (1999-11-01), Shirasaki
patent: 7187442 (2007-03-01), Chinnock et al.
patent: 2006/0126066 (2006-06-01), Kawakami et al.

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