Low-cost, low-voltage single-layer polycrystalline EEPROM...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S314000, C257SE29170, C257SE29309, C438S201000, C438S288000, C438S573000

Reexamination Certificate

active

11136140

ABSTRACT:
An EEPROM memory transistor having a floating gate. The floating gate is formed using a BiCMOS process and has a first sinker dopant region proximate to a tunnel diode window, and a second sinker dopant region proximate to a coupling capacitor region. An optional third sinker region may be formed proximate to a source junction of the EEPROM memory transistor. Also, a shallow trench isolation (STI) region may be formed between the first and second sinker dopant regions.

REFERENCES:
patent: 5248624 (1993-09-01), Icel et al.
patent: 5909400 (1999-06-01), Bertin et al.
patent: 6022778 (2000-02-01), Contiero et al.
patent: 6025625 (2000-02-01), Chi
patent: 6172392 (2001-01-01), Schmidt et al.
patent: 6208559 (2001-03-01), Tu et al.
patent: 6438030 (2002-08-01), Hu et al.
patent: 6532170 (2003-03-01), Madurawe et al.

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