Long path at-speed testing

Details Long path at-speed testing Long path at-speed testing

2006-06-20

2006-06-20

Decady, Albert (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

C714S744000

Reexamination Certificate

active

07065683

ABSTRACT:
An apparatus including a plurality of first base circuits, a plurality of second base circuits, a first test circuit, a second test circuit, and a test path. The plurality of first base circuits may be coupled to the plurality of second base circuits via one or more base circuit paths on a layout. The first test circuit may be disposed in a first distal location of the layout. The second test circuit may be disposed in a second distal location of the layout. The test path may be configured to (i) couple the first test circuit to the second test circuit and (ii) generate a test time delay from the first test circuit to the second test circuit incrementally longer than a maximum time delay generated by any of the base circuit paths.

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