Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate
2009-05-07
2011-12-06
Patel, Kaushikkumar (Department: 2186)
Static information storage and retrieval
Read/write circuit
Having fuse element
C365S189050, C714S718000
Reexamination Certificate
active
08072830
ABSTRACT:
A semiconductor integrated circuit device includes a plurality of memory macros, macro-common register block, and memory macro operation setting circuits. The macro-common register block has macro-common registers which are provided outside the plurality of memory macros and supply memory macro operation specifying signals to the plurality of memory macros. The memory macro operation setting circuits are respectively provided in the plurality of memory macros and are each configured to set an operating state of the memory macro in response to the memory macro operation specifying signal supplied from the macro-common register.
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Michael R. Ouellette, et al., “Shared Fuse Macro for Multiple Embedded Memory Devices with Redundancy”, IEEE Custom Integrated Circuits Conference Digest, 2001, pp. 191-194.
Japanese Office Action issued Jan. 18, 2011, in Patent Application No. 2005-008138 (with English Translation).
Japanese Office Action issued on Apr. 12, 2011 in corresponding Japanese Application No. 2005-008138 (with an English Translation).
Kabushiki Kaisha Toshiba
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
Patel Kaushikkumar
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