Logic circuit with a test capability

Details Logic circuit with a test capability Logic circuit with a test capability

1981-11-24

1984-01-03

Fears, Terrell W.

Static information storage and retrieval

Systems using particular element

Flip-flop

365189, G11C 1300

Patent

active

044245815

ABSTRACT:
A flip-flop circuit receives a portion of a multiple bit output from a combinational logic circuit to be tested, and feeds back a plurality of bits to comprise a portion of the multiple bit input to the combinational logic circuit. The flip-flop circuit includes a plurality of master and slave flip-flops with the master flip-flops being operable in parallel to receive the output from the combinational logic circuit or in series as a shift register, and the slave flip-flops being operable either in parallel to receive outputs from the master flip-flops or in series as a shift register. The occurrence of a fault in a combinational logic circuit can be determined by examining the contents of either the master or slave flip-flops at a particular clock cycle.

REFERENCES:
patent: 4373195 (1983-02-01), Toyoda et al.

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