Lock-out device and semiconductor integrated circuit device...

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Reexamination Certificate

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C365S226000, C714S014000, C714S022000

Reexamination Certificate

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07463543

ABSTRACT:
A lock-out device is provided that determines whether to lock out a chip or not according to the result of operation voltage drop detected at a plurality of positions in a semiconductor integrated circuit device. As a result, unnecessary lock-out operations can be prevented and a program operation or an erase operation in a semiconductor memory device can be executed stably.

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patent: 05-020863 (1993-01-01), None
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patent: 11-003586 (1999-01-01), None
patent: 1020020091677 (2002-12-01), None
Korean Intellectual Property Office, “Notice to File a Response/Amendment to the Examination Report” corresponding to Korean Patent Application No. 10-2004-0113191, mailed Apr. 12, 2006.

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