Static information storage and retrieval – Powering – Data preservation
Reexamination Certificate
2005-10-05
2008-12-09
Nguyen, Van Thu (Department: 2824)
Static information storage and retrieval
Powering
Data preservation
C365S226000, C714S014000, C714S022000
Reexamination Certificate
active
07463543
ABSTRACT:
A lock-out device is provided that determines whether to lock out a chip or not according to the result of operation voltage drop detected at a plurality of positions in a semiconductor integrated circuit device. As a result, unnecessary lock-out operations can be prevented and a program operation or an erase operation in a semiconductor memory device can be executed stably.
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Korean Intellectual Property Office, “Notice to File a Response/Amendment to the Examination Report” corresponding to Korean Patent Application No. 10-2004-0113191, mailed Apr. 12, 2006.
Myers Bigel Sibley & Sajovec P.A.
Nguyen Van Thu
Samsung Electronics Co,. Ltd.
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