Locally thinned fins

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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Details

C438S218000, C438S294000, C438S514000, C438S410000, C438S157000, C438S283000, C438S481000, C438S156000, C438S151000

Reexamination Certificate

active

07087471

ABSTRACT:
In a FinFET integrated circuit, the fins are formed with a reduced body thickness in the body area and then thickened in the S/D area outside the body to improve conductivity. The thickening is performed with epitaxial deposition while the lower portion of the gates are covered by a gate cover layer to prevent thickening of the gates at the fin level, which may short the gate to the S/D.

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patent: 2005/0029603 (2005-02-01), Yu et al.
patent: 2005/0036415 (2005-02-01), Yoshida et al.

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