Lithographic semiconductor manufacturing using a...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

Reexamination Certificate

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C430S394000

Reexamination Certificate

active

10710023

ABSTRACT:
Multilayer resist systems and techniques used for liftoff or planarizing topography wherein the dimensions and thicknesses of the layers are independently controlled. The undercut may also be independently controlled for precision structures.

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