Lithographic apparatus and device manufacturing method

Photocopying – Projection printing and copying cameras – Illumination systems or details

Reexamination Certificate

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Details

C355S053000, C356S498000

Reexamination Certificate

active

07349072

ABSTRACT:
Embodiments of the invention include an interferometer measurement system in which at least one reflective surface is arranged such that, in use, the beam path of interferometer radiation of the interferometer measurement system incident on the at least one reflective surface has an offset angle in the range of from 0.1 to 10 milliradians with respect to the normal to the at least one reflective surface. In that way, the effect of spurious radiation on the interferometer measurement system produced within the interferometer measurement system may be suppressed. In another embodiment, a parallel-sided plate is used in an interferometer measurement system to obtain a signal dependent on the angle of a beam of radiation reflected from a mirror. In that way, the flatness of the mirror can be mapped. One surface of the plate is a beam-splitter and the opposite surface of the plate is a reflector.

REFERENCES:
patent: 4746216 (1988-05-01), Sommargren
patent: 5398112 (1995-03-01), Ai et al.
patent: 2001/0035959 (2001-11-01), Hill
patent: 2003/0020921 (2003-01-01), Hill
patent: 2003/0038947 (2003-02-01), Hill
patent: 2003/0053074 (2003-03-01), Hill
patent: 2003/0197870 (2003-10-01), Bagwell et al.
patent: 11-125503 (1999-11-01), None
patent: 2003-028609 (2003-01-01), None
patent: WO 03/019109 (2003-03-01), None
European Search Report completed Aug. 4, 2004.

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