Lithographic apparatus and device manufacturing method

Photocopying – Projection printing and copying cameras – Step and repeat

Reexamination Certificate

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Details

C355S072000, C355S075000, C700S045000, C700S121000

Reexamination Certificate

active

07576832

ABSTRACT:
A lithographic apparatus includes a movable object and a control system to control the position of the movable object. The control system includes a position measurement system configured to measure the position of the movable object, a comparative unit configured to generate a servo error signal by subtracting a position signal representative of an actual position of the movable object from a reference signal, a control unit configured to generate a first control signal based on the servo error signal, a feed-forward unit configured to generate a feed-forward signal based on the reference signal, an addition unit configured to generate a second control signal by adding the first control signal and the feed-forward signal, and an actuator unit configured to actuate the movable object. A gain of the feed-forward unit is dependent on the position of the movable object.

REFERENCES:
patent: 6025688 (2000-02-01), Sekiguchi
patent: 2004/0021840 (2004-02-01), Heintze
patent: 2004/0176861 (2004-09-01), Butler
patent: 2005/0267609 (2005-12-01), Van Donkelaar et al.
patent: 2006/0077364 (2006-04-01), Cox et al.
patent: 2006/0119829 (2006-06-01), Cox et al.
2005 IEEE Conference on Control Applications, Aug. 28-31, 2005, Toronto, Canada, TC 1.6, Metthijs Boerlage, Maarteen Steinbuch, Georgo Angelis: “Frequency response based multivariable control design for motion systems”.
Control Engineering Practice 13, Feb. 2005, p. 145-157, Paul Lambrechts, Matthijs Boerlage, Maarteen Steinbuch: “Trajectory and feed forward design for electrochemical motion systems”.
2004 American Control Conference, Jun. 30-Jul. 2, 2004, Boston Massachusetts, FrM09.4, Matthijs Boerlage, Rob Tousain, Maarten Steinbuch: “Jerk derivative feed forward control for motion systems”.
Control engineering Practice 10, 2002, p. 739-755, Marc van de Wal, Gregor van Baars, Frank Sperling, Okko Bosgra: “Multivariable H—inf/mu feedback control design for high-precision wafer stage motion”.

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