Liquified nitrogen thermal checking of electronic circuitry

Thermal measuring and testing – Leak or flaw detection – With heating or cooling of specimen for test

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

62293, 324158F, 374 57, G01N 2572, G01R 3102

Patent

active

052229998

ABSTRACT:
Electronic circuitry 22, 24, 26 is thermally checked by cooling with liquified nitrogen from a cryogenic delivery unit 19, directly by means of a stream 10 or a spray 28 delivered through an aperture 11, 30 of the delivery unit 19 spaced from the surface of the circuitry.

REFERENCES:
patent: 2643282 (1953-06-01), Greene
patent: 3483721 (1969-12-01), Apple et al.
patent: 3710251 (1973-01-01), Hagge et al.
patent: 3782386 (1974-01-01), Barger et al.
patent: 3934451 (1976-01-01), Bristoll et al.
patent: 3993075 (1971-11-01), Lisenbee et al.
patent: 4015606 (1977-04-01), Mitchiner et al.
patent: 4072152 (1978-02-01), Linehan
patent: 4269390 (1981-05-01), Bryne
patent: 4426619 (1984-01-01), Demand
patent: 4487253 (1984-12-01), Malek et al.
patent: 4503335 (1985-03-01), Takakashi
patent: 4787752 (1988-11-01), Fraser et al.
patent: 4831846 (1989-05-01), Sungaila
patent: 4838041 (1989-06-01), Bellows et al.
patent: 4872762 (1989-10-01), Koshihara et al.
patent: 4934151 (1990-06-01), Shima
patent: 4954774 (1990-09-01), Binet
patent: 5099908 (1992-03-01), Taraci et al.
"Physical Constants" of Nitrogen in the CRC Handbook of Chemistry & Physics Robert C. Weast, et al, Editors p. B-103 1981.
"Device for Obtaining Temperatures of 4.2.degree.-300.degree. K. with Considerable Heat Flow Into Specimen", V I. Silaev et al. Instrument & Exp Tech. (USA), vol. 20, No. 3 PE2, pp. 864-865, (May-Jun. 1977, Publ. Dec. 1977).
"Close-Cycle Liquid Nitrogen Refrigeration System for Low-Temperature Computer Operation", V. L. Rideout, IBM Technical Disc. Bulletin, vol. 18, No. 4, Sep. 1975, (pp. 1226-1229).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Liquified nitrogen thermal checking of electronic circuitry does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Liquified nitrogen thermal checking of electronic circuitry, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Liquified nitrogen thermal checking of electronic circuitry will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1751875

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.