Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2005-03-15
2005-03-15
Pham, Hoai (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S151000, C438S722000
Reexamination Certificate
active
06867076
ABSTRACT:
A thin film transistor having a source/drain electrode on an insulating substrate is provided with a metal oxide layer interposed between a source/drain electrode and a metal connecting line. The formation of the metal oxide layer prevents the occurrence of the galvanic phenomenon.
REFERENCES:
patent: 5422921 (1995-06-01), Chiba
patent: 5434439 (1995-07-01), Ajika et al.
patent: 5847410 (1998-12-01), Nakajima
patent: 8-062628 (1996-03-01), None
patent: 9-203911 (1997-08-01), None
Choi Jae-Beom
Lee Sang-Gul
Park Yong-In
Yi Jong-Hoon
Birch & Stewart Kolasch & Birch, LLP
LG. Philips LCD Co. Ltd.
Pham Hoai
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